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DAC
2008
ACM
14 years 9 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
SIGMOD
2008
ACM
65views Database» more  SIGMOD 2008»
14 years 8 months ago
Generating targeted queries for database testing
Tools for generating test queries for databases do not explicitly take into account the actual data in the database. As a consequence, such tools cannot guarantee suitable coverag...
Chaitanya Mishra, Nick Koudas, Calisto Zuzarte
COMPSAC
2008
IEEE
14 years 2 months ago
Mutation-Based Testing of Buffer Overflow Vulnerabilities
Buffer overflow (BOF) is one of the major vulnerabilities that leads to non-secure software. Testing an implementation for BOF vulnerabilities is challenging as the underlying rea...
Hossain Shahriar, Mohammad Zulkernine
VTS
2007
IEEE
103views Hardware» more  VTS 2007»
14 years 2 months ago
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner
ISSTA
2006
ACM
14 years 2 months ago
Coverage metrics for requirements-based testing
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
Michael W. Whalen, Ajitha Rajan, Mats Per Erik Hei...