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QSIC
2005
IEEE
14 years 1 months ago
Software Testing Education and Training in Hong Kong
While the use of computer applications is widely spread in every business and, hence, the reliability of software is critical, it is believed that many organizations involved in s...
F. T. Chan, W. H. Tang, T. Y. Chen
DFT
2003
IEEE
113views VLSI» more  DFT 2003»
14 years 1 months ago
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
ITC
2003
IEEE
148views Hardware» more  ITC 2003»
14 years 1 months ago
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...
Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Dega...
GECCO
2003
Springer
108views Optimization» more  GECCO 2003»
14 years 1 months ago
Evolutionary Testing of Flag Conditions
Evolutionary Testing (ET) has been shown to be very successful in testing real world applications [16]. However, it has been pointed out [11], that further research is necessary if...
André Baresel, Harmen Sthamer
ATS
2009
IEEE
127views Hardware» more  ATS 2009»
14 years 1 months ago
On the Generation of Functional Test Programs for the Cache Replacement Logic
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
Wilson J. Perez, Danilo Ravotto, Edgar E. Sá...