6941 search results - page 203 / 1389 » Testing as a Certification Approach |
ICSE
2009
IEEE-ACM
14 years 2 months ago
2009
IEEE-ACM
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
HICSS
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper describes the design of a test suite for thorough evaluation of web application scanners. Web application scanners are automated, black-box testing tools that examine w...
DDECS
2007
IEEE
14 years 2 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
SIGSOFT
2006
ACM
14 years 2 months ago
2006
ACM
Developers of distributed systems routinely construct discrete-event simulations to help understand and evaluate the behavior of inter-component protocols. Simulations are abstrac...