11718 search results - page 107 / 2344 » Testing database applications |
183
Voted
MTA
2011
14 years 9 months ago
2011
In this paper we describe a database of static images of human faces. Images were taken in uncontrolled indoor environment using five video surveillance cameras of various qualitie...
104
Voted
DATE
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
127
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ISOLA
2004
Springer
15 years 8 months ago
2004
Springer
The article is concerned with an approach to model based test development for large software systems. The approach presented is a part of UniTesK test development technology, which...
122
Voted
VTS
2008
IEEE
15 years 9 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
102
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SAC
2009
ACM
15 years 9 months ago
2009
ACM
This paper presents a methodology for interoperability testing based on contextual signatures and passive testing with invariants. The concept of contextual signature offers a fra...