11718 search results - page 114 / 2344 » Testing database applications |
130
Voted
ASPDAC
2007
ACM
15 years 6 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
158
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ICSM
2009
IEEE
15 years 9 months ago
2009
IEEE
Most of today’s event driven software (EDS) systems are tested using test cases that are carefully constructed as sequences of events; they test the execution of an event in the...
94
Voted
ESEM
2007
ACM
15 years 6 months ago
2007
ACM
This paper presents a controlled experiment comparing the defect detection efficiency of exploratory testing (ET) and test case based testing (TCT). While traditional testing lite...
144
Voted
ICSE
2003
IEEE-ACM
16 years 2 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
123
Voted
VLSID
2005
IEEE
16 years 3 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...