80 search results - page 10 / 16 » Testing embedded-core based system chips |
VTS
2005
IEEE
14 years 4 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
DFT
2008
IEEE
14 years 5 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
BIOINFORMATICS
2005
13 years 10 months ago
2005
: Doelan is an automated tool to check the quality of produced DNA microarrays. This software is based on the execution of test suites on quality control data to validate batches o...
CASES
2001
ACM
14 years 2 months ago
2001
ACM
Increased systems level integration has meant the movement of many traditionally off chip components onto a single chip including a processor, instruction storage, data path, and ...
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...