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23

VTS
1996
IEEE

74views Hardware» more VTS 1996»

An unexpected factor in testing for CMOS opens: the die surface

13 years 11 months ago

In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...

Haluk Konuk, F. Joel Ferguson

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21

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ET
2007

119views more ET 2007»

Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

13 years 7 months ago

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In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...

Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...

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23

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FASE
2006
Springer

144views Software Engineering» more FASE 2006»

Automated Systematic Testing of Open Distributed Programs

13 years 11 months ago

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We present an algorithm for automatic testing of distributed programs, such as Unix processes with inter-process communication and Web services. Specifically, we assume that a prog...

Koushik Sen, Gul Agha

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22

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SIGSOFT
2004
ACM

124views Software Engineering» more SIGSOFT 2004»

Testing static analysis tools using exploitable buffer overflows from open source code

14 years 8 months ago

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Five modern static analysis tools (ARCHER, BOON, PolySpace C Verifier, Splint, and UNO) were evaluated using source code examples containing 14 exploitable buffer overflow vulnera...

Misha Zitser, Richard Lippmann, Tim Leek

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11

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DATE
2008
IEEE

76views Hardware» more DATE 2008»

On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits

14 years 1 months ago