— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
Harald P. E. Vranken, Friedrich Hapke, Soenke Rogg...
This paper promotes the use of supervised machine learning in laboratory settings where chemists have a large number of samples to test for some property, and are interested in id...
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Background: In recent years, gene order data has attracted increasing attention from both biologists and computer scientists as a new type of data for phylogenetic analysis. If ge...