In unit testing, a program is decomposed into units which are collections of functions. A part of unit can be tested by generating inputs for a single entry function. The entry fu...
Abstract-- A complementary ferroelectriccapacitor (CFC) logic-circuit style is proposed for a compact and standby-power-free content-addressable memory (CAM). Since the use of the ...
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
Three different partial differential equation (PDE) solver kernels are analyzed in respect to cache memory performance on a simulated shared memory computer. The kernels implement...
Support for optimistic parallelism such as thread-level speculation (TLS) and transactional memory (TM) has been proposed to ease the task of parallelizing software to exploit the...