507 search results - page 81 / 102 » Testing implementations of transactional memory |
EH
2002
IEEE
14 years 17 days ago
2002
IEEE
The purpose of this paper is twofold: first, to illustrate a stand-alone board-level evolvable system (SABLES) and its performance, and second to illustrate some problems that occ...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
CGF
1998
13 years 7 months ago
1998
In this paper, we present an e cient algorithm for contact determination between spline models. We make use of a new hierarchy, called ShellTree, that comprises of spherical shell...
APN
2005
Springer
14 years 1 months ago
2005
Springer
Under the umbrella of buzzwords such as “Business Activity Monitoring” (BAM) and “Business Process Intelligence” (BPI) both academic (e.g., EMiT, Little Thumb, InWoLvE, Pro...
DATE
2003
IEEE
14 years 27 days ago
2003
IEEE
ng precision of abstract SystemC models using the SystemC Verification Standard Franco Carbognani1 , Christopher K. Lennard2 , C. Norris Ip3 , Allan Cochrane2 , Paul Bates2 1 Caden...