1664 search results - page 22 / 333 » Testing in the Component Age |
GECCO
2009
Springer
14 years 3 months ago
2009
Springer
The objectives of this paper are to describe a steady-state version of the Age-Layered Population Structure (ALPS) Evolutionary Algorithm (EA) and to compare it against other GAs ...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
SEKE
2004
Springer
14 years 2 months ago
2004
Springer
Development of a software system from existing components can surely have various benefits, but can also entail a series of problems. One type of problems is caused by a limited ...
ISSRE
2000
IEEE
14 years 1 months ago
2000
IEEE
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Moore’s Law will soon deliver tera-scale level transistor integration capacity. Power, variability, reliability, aging, and testing will pose as barriers and challenges to harne...