Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
The complexity of distributed systems is a problem when designers want to evaluate their safety and liveness. Often, they are built by integration of existing components with newl...
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
Two main issues need to be covered when dealing with the dependability of component-based systems: quality assurance of reusable software components and quality assurance of the a...
Henry Muccini, Marcio S. Dias, Debra J. Richardson