1664 search results - page 33 / 333 » Testing in the Component Age |
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
RSP
1998
IEEE
14 years 27 days ago
1998
IEEE
The complexity of distributed systems is a problem when designers want to evaluate their safety and liveness. Often, they are built by integration of existing components with newl...
ITC
1997
IEEE
14 years 26 days ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
ITC
1993
IEEE
14 years 23 days ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
COMPSAC
2005
IEEE
14 years 2 months ago
2005
IEEE
Two main issues need to be covered when dealing with the dependability of component-based systems: quality assurance of reusable software components and quality assurance of the a...