1664 search results - page 78 / 333 » Testing in the Component Age |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
ET
2000
13 years 9 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
ASPDAC
2006
ACM
14 years 3 months ago
2006
ACM
– An instruction set level reference model was developed for the development of synergistic processing unit (SPU) , which is one of the key components of the cell processor [1][2...
ITC
2002
IEEE
14 years 2 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
IEEEARES
2009
IEEE
14 years 4 months ago
2009
IEEE
—The security assessment of the ICT components of critical infrastructures is nowadays a prominent problem. Risk assessment methodologies require, in order to be effective, to be...