2686 search results - page 78 / 538 » Testing metric properties |
DAC
2012
ACM
12 years 12 days ago
2012
ACM
In this work we address the problem of managing interconnect timing in high-level synthesis by generating a layoutfriendly microarchitecture. A metric called spreading score is pr...
IOLTS
2008
IEEE
14 years 4 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
ICCV
2009
IEEE
15 years 3 months ago
2009
IEEE
Image auto-annotation is an important open problem in
computer vision. For this task we propose TagProp, a discriminatively
trained nearest neighbor model. Tags of test
images a...
CVPR
2005
IEEE
15 years 17 hour ago
2005
IEEE
We present a method for training a similarity metric from data. The method can be used for recognition or verification applications where the number of categories is very large an...
ICML
2009
IEEE
14 years 10 months ago
2009
IEEE
In many real-world applications, such as image retrieval, it would be natural to measure the distances from one instance to others using instance specific distance which captures ...