1618 search results - page 110 / 324 » Testing random number generators |
DAC
2000
ACM
14 years 11 months ago
2000
ACM
Recently, intellectual property protection (IPP) techniques attracted a great deal of attention from semiconductor, system integration and software companies. A number of watermar...
VTS
2008
IEEE
14 years 4 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
ARITH
1999
IEEE
14 years 2 months ago
1999
IEEE
Comprehensive testing of any implementation of the RSA cryptosystem requires the use of a number of moduli with specific properties. It is shown how to generate a sufficient varie...
IWC
2006
13 years 10 months ago
2006
This paper identifies a number of factors involved in current practices of usability testing and presents profiles for three prototype methods: think-aloud, subjective ratings, an...