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DATE
2007
IEEE
86views Hardware» more  DATE 2007»
14 years 4 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
KDD
2002
ACM
160views Data Mining» more  KDD 2002»
14 years 10 months ago
Scaling multi-class support vector machines using inter-class confusion
Support vector machines (SVMs) excel at two-class discriminative learning problems. They often outperform generative classifiers, especially those that use inaccurate generative m...
Shantanu Godbole, Sunita Sarawagi, Soumen Chakraba...
FCCM
2007
IEEE
107views VLSI» more  FCCM 2007»
14 years 4 months ago
Optimizing Logarithmic Arithmetic on FPGAs
This paper proposes optimizations of the methods and parameters used in both mathematical approximation and hardware design for logarithmic number system (LNS) arithmetic. First, ...
Haohuan Fu, Oskar Mencer, Wayne Luk
TAMC
2010
Springer
14 years 3 months ago
Streaming Algorithms for Some Problems in Log-Space
Abstract. In this paper, we give streaming algorithms for some problems which are known to be in deterministic log-space, when the number of passes made on the input is unbounded. ...
Ajesh Babu, Nutan Limaye, Girish Varma
ECCC
2011
204views ECommerce» more  ECCC 2011»
13 years 1 months ago
Dense locally testable codes cannot have constant rate and distance
A q-query locally testable code (LTC) is an error correcting code that can be tested by a randomized algorithm that reads at most q symbols from the given word. An important questi...
Irit Dinur, Tali Kaufman