1618 search results - page 17 / 324 » Testing random number generators |
ENTCS
2002
13 years 9 months ago
2002
The difficulty of finding errors caused by unexpected interleavings of threads in concurrent programs is well known. Model checkers can pinpoint such errors and verify correctness...
CORR
2011
Springer
13 years 4 months ago
2011
Springer
— The problem of random number generation dates
IOLTS
2000
IEEE
14 years 2 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
ATS
2000
IEEE
14 years 2 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...