1618 search results - page 49 / 324 » Testing random number generators |
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
ICST
2008
IEEE
14 years 4 months ago
2008
IEEE
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
EUROGP
2003
Springer
14 years 3 months ago
2003
Springer
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
QSIC
2003
IEEE
14 years 3 months ago
2003
IEEE
A character string is an important element in programming. A problem that needs further research is how to automatically generate software test data for character strings. This pa...