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CEC
2009
IEEE
14 years 4 months ago
An evaluation of Differential Evolution in software test data generation
— One of the main tasks software testing involves is the generation of the test inputs to be used during the test. Due to its expensive cost, the automation of this task has beco...
Ricardo Landa Becerra, Ramón Sagarna, Xin Y...
ICCAD
2006
IEEE
134views Hardware» more  ICCAD 2006»
14 years 6 months ago
A delay fault model for at-speed fault simulation and test generation
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
Irith Pomeranz, Sudhakar M. Reddy
QSIC
2003
IEEE
14 years 3 months ago
Generating Small Combinatorial Test Suites to Cover Input-Output Relationships
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
Christine Cheng, Adrian Dumitrescu, Patrick J. Sch...
ICMT
2009
Springer
14 years 4 months ago
Automatic Model Generation Strategies for Model Transformation Testing
Testing model transformations requires input models which are graphs of inter-connected objects that must conform to a meta-model and meta-constraints from heterogeneous sources su...
Sagar Sen, Benoit Baudry, Jean-Marie Mottu
ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
14 years 6 months ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...