98 search results - page 19 / 20 » Testing real-time embedded software using UPPAAL-TRON: an in... |
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
HIPEAC
2009
Springer
14 years 3 months ago
2009
Springer
Process variations, which lead to timing and power variations across identically-designed components, have been identified as one of the key future design challenges by the semico...
SENSYS
2010
ACM
13 years 6 months ago
2010
ACM
Wireless sensor networks (WSNs) are hard to program due to unconventional programming models used to satisfy stringent resource constraints. The common event-driven concurrent pro...
SOFTVIS
2010
ACM
13 years 6 months ago
2010
ACM
Large clusters of mutual dependence have long been regarded as a problem impeding comprehension, testing, maintenance, and reverse engineering. An effective visualization can aid ...
ICTAC
2010
Springer
13 years 7 months ago
2010
Springer
Material Flow Abstraction of Manufacturing Systems. ‣Umberto Costa, Ivan de Medeiros Jr and Marcel Oliveira. Specification and Verification of a MPI Implementation for a MP-SoC...