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DATE
2008
IEEE
66views Hardware» more  DATE 2008»
14 years 2 months ago
Wrapper and TAM Co-Optimization for Reuse of SoC Functional Interconnects
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
Tomokazu Yoneda, Hideo Fujiwara
ISTCS
1995
Springer
13 years 11 months ago
Some Improvements to Total Degree Tests
A low-degree test is a collection of simple, local rules for checking the proximity of an arbitrary function to a lowdegree polynomial. Each rule depends on the function’s value...
Katalin Friedl, Madhu Sudan
SPLC
2008
13 years 9 months ago
Service-Oriented Commonality Analysis Across Existing Systems
This paper introduces an extractive approach to building-up a product line based on existing systems. Thereby, we focus on the analysis of common functionalities across different ...
Alexander Harhurin, Judith Hartmann
ICIAP
2005
ACM
14 years 8 months ago
3D Functional Models of Monkey Brain Through Elastic Registration of Histological Sections
In this paper we describe a method for the reconstruction and visualization of functional models of monkey brains. Models are built through the registration of high resolution imag...
Fabio Bettio, Francesca Frexia, Andrea Giachetti, ...
TR
2008
88views more  TR 2008»
13 years 8 months ago
Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions
Abstract--This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maxi...
Syuan-Rong Huang, Shuo-Jye Wu