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85
Voted
DATE
2008
IEEE
15 years 9 months ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
120
Voted
ISTCS
1995
Springer
15 years 6 months ago
1995
Springer
A low-degree test is a collection of simple, local rules for checking the proximity of an arbitrary function to a lowdegree polynomial. Each rule depends on the function’s value...
102
Voted
SPLC
2008
15 years 4 months ago
2008
This paper introduces an extractive approach to building-up a product line based on existing systems. Thereby, we focus on the analysis of common functionalities across different ...
131
Voted
ICIAP
2005
ACM
16 years 2 months ago
2005
ACM
In this paper we describe a method for the reconstruction and visualization of functional models of monkey brains. Models are built through the registration of high resolution imag...
129
Voted
TR
2008
15 years 2 months ago
2008
Abstract--This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maxi...