6800 search results - page 55 / 1360 » Testing with Functions as Specifications |
DATE
1998
IEEE
14 years 4 days ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
SAFECOMP
2005
Springer
14 years 1 months ago
2005
Springer
As programmable logic controllers(PLCs) have been used in safety-critical applications, testing of PLC applications has become important. The previous PLC-based software testing te...
DAC
1994
ACM
13 years 12 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
CORR
2010
Springer
13 years 5 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
FORTE
2003
13 years 9 months ago
2003
Abstract. In this paper, we propose a testing method for QoS functions in distributed multi-media systems, where we test whether playback of media objects is correctly implemented ...