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ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
13 years 11 months ago
Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz
TAICPART
2010
IEEE
126views Education» more  TAICPART 2010»
13 years 5 months ago
Improved Testing through Refactoring: Experience from the ProTest Project
We report on how the Wrangler refactoring tool has been used to improve and transform test code for Erlang systems. This has been achieved through the removal of code clones, the i...
Huiqing Li, Simon J. Thompson
ICSM
2008
IEEE
14 years 1 months ago
REST: A tool for reducing effort in script-based testing
Since manual black-box testing of GUI-based APplications (GAPs) is tedious and laborious, test engineers create test scripts to automate the testing process. These test scripts in...
Qing Xie, Mark Grechanik, Chen Fu
LOPSTR
2009
Springer
14 years 2 months ago
Using Rewrite Strategies for Testing BUpL Agents
Abstract. In this paper we focus on the problem of testing agent programs written in BUpL, an executable, high-level modelling agent language. Our approach consists of two main ste...
Lacramioara Astefanoaei, Frank S. de Boer, M. Birn...
ITC
1998
IEEE
174views Hardware» more  ITC 1998»
13 years 11 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong