2006 search results - page 12 / 402 » Testing with Respect to Concerns |
ISSRE
2006
IEEE
14 years 1 months ago
2006
IEEE
Test suite reduction uses test requirement coverage to determine if the reduced test suite maintains the original suite’s requirement coverage. Based on observations from our pr...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
AIED
2005
Springer
13 years 9 months ago
2005
Springer
In this paper, we discuss the development of a theoretical framework for introducing adaptive presentation in adaptive testing. To this end, a discussion of some aspects concerning...
IOLTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a...
SOQUA
2004
13 years 8 months ago
2004
: Aspect-Oriented Programming (AOP) provides new constructs and tools to handle cross-cutting concerns in programs. Fully realizing the potentials of riented Software Development r...