2006 search results - page 20 / 402 » Testing with Respect to Concerns |
ET
2002
13 years 7 months ago
2002
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
PVM
1998
Springer
13 years 11 months ago
1998
Springer
Abstract. Amongst its many features, MPI-2 offers the first standard highperformance I/O interface. While this enables a parallel and I/O intensive code to run on multiple platform...
DSRT
2002
IEEE
14 years 14 days ago
2002
IEEE
The paper describes an experimental web-based environment for teaching and testing. The application named Nautilus has been developed using Virtual Reality Modeling Language (VRML...
COLING
1996
13 years 8 months ago
1996
This article is concerned with the building of a test data set for assisting the industrial user in machine translation evaluation. The emphasis is laid on the interest of an appr...