2006 search results - page 52 / 402 » Testing with Respect to Concerns |
GLVLSI
2007
IEEE
14 years 3 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
ECAI
2010
Springer
13 years 10 months ago
2010
Springer
Answer-set programming (ASP) is a well-acknowledged paradigm for declarative problem solving, yet comparably little effort has been spent on the investigation of methods to support...
TCAD
1998
13 years 8 months ago
1998
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
ICSE
2005
IEEE-ACM
14 years 9 months ago
2005
IEEE-ACM
Some software defects trigger failures only when certain complex information flows occur within the software. Profiling and analyzing such flows therefore provides a potentially i...
KBSE
2008
IEEE
14 years 3 months ago
2008
IEEE
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...