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ALT
2008
Springer
14 years 5 months ago
Nonparametric Independence Tests: Space Partitioning and Kernel Approaches
Abstract. Three simple and explicit procedures for testing the independence of two multi-dimensional random variables are described. Two of the associated test statistics (L1, log-...
Arthur Gretton, László Györfi
ISESE
2002
IEEE
14 years 1 months ago
Elimination of Crucial Faults by a New Selective Testing Method
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing...
Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu,...
ATS
2005
IEEE
191views Hardware» more  ATS 2005»
14 years 2 months ago
Low Transition LFSR for BIST-Based Applications
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
ITC
2003
IEEE
172views Hardware» more  ITC 2003»
14 years 2 months ago
First IC Validation of IEEE Std. 1149.6
–This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests...
Suzette Vandivier, Mark Wahl, Jeff Rearick
LWA
2004
13 years 10 months ago
Modeling Rule Precision
This paper reports first results of an empirical study of the precision of classification rules on an independent test set. We generated a large number of rules using a general co...
Johannes Fürnkranz