3 search results - page 1 / 1 » The Certainty of Uncertainty: Randomness in Nanometer Design |
PATMOS
2004
Springer
14 years 3 months ago
2004
Springer
MICCAI
2009
Springer
14 years 11 months ago
2009
Springer
We propose a novel method for deformable tensor?to?tensor registration of Diffusion Tensor Imaging (DTI) data. Our registration method considers estimated diffusion tensors as norm...
ASPDAC
2008
ACM
13 years 11 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...