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PATMOS
2004
Springer

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110views Modeling and Simulation» more PATMOS 2004»

The Certainty of Uncertainty: Randomness in Nanometer Design

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The Certainty of Uncertainty: Randomness in Nanometer Design

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Hongliang Chang, Haifeng Qian, Sachin S. Sapatneka

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Added	02 Jul 2010
Updated	02 Jul 2010
Type	Conference
Year	2004
Where	PATMOS
Authors	Hongliang Chang, Haifeng Qian, Sachin S. Sapatnekar

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