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» The Complexity of Planarity Testing
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CODES
2000
IEEE
15 years 8 months ago
Automatic test bench generation for simulation-based validation
In current design practice synthesis tools play a key role, letting designers to concentrate on the specificationof the system being designed by carrying out repetitive tasks such...
Marcello Lajolo, Luciano Lavagno, Maurizio Rebaude...
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
15 years 8 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
113
Voted
ITC
1998
IEEE
94views Hardware» more  ITC 1998»
15 years 8 months ago
Testing embedded-core based system chips
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse...
Yervant Zorian, Erik Jan Marinissen, Sujit Dey
IJON
2002
67views more  IJON 2002»
15 years 3 months ago
Test of spike-sorting algorithms on the basis of simulated network data
: Results of spike sorting algorithms are usually compared against recorded signals which themselves underly interpretations, distortions and errors. Our approach is to provide and...
Kerstin M. L. Menne, Andre Folkers, Thomas Malina,...
176
Voted
RANDOM
2001
Springer
15 years 8 months ago
Proclaiming Dictators and Juntas or Testing Boolean Formulae
We consider the problem of determining whether a given function ¢ £ ¤¥ ¦ §¨©  ¤¥ ¦ §¨ belongs to a certain class of Boolean functions  or whether it is far from the...
Michal Parnas, Dana Ron, Alex Samorodnitsky