2877 search results - page 119 / 576 » The Complexity of Planarity Testing |
137
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ICCD
2008
IEEE
16 years 1 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
138
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ECCC
2010
15 years 1 months ago
2010
We investigate the number of samples required for testing the monotonicity of a distribution with respect to an arbitrary underlying partially ordered set. Our first result is a n...
151
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SIGSOFT
2008
ACM
16 years 4 months ago
2008
ACM
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
154
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EVOW
2001
Springer
15 years 8 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
131
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EDBT
2004
ACM
16 years 4 months ago
2004
ACM
In this paper we present HOPI, a new connection index for XML documents based on the concept of the 2?hop cover of a directed graph introduced by Cohen et al. In contrast to most o...