Sciweavers

2877 search results - page 130 / 576
» The Complexity of Planarity Testing
Sort
View
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
15 years 10 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
APSEC
2005
IEEE
15 years 10 months ago
An Integrated Solution for Testing and Analyzing Java Applications in an Industrial Setting
Testing a large-scale, real-life commercial software application is a very challenging task due to the constant changes in the software, the involvement of multiple programmers an...
W. Eric Wong, J. Jenny Li
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 9 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
FASE
2005
Springer
15 years 9 months ago
Coverage Criteria for Testing of Object Interactions in Sequence Diagrams
This work defines several control-flow coverage criteria for testing the interactions among a set of collaborating objects. The criteria are based on UML sequence diagrams that a...
Atanas Rountev, Scott Kagan, Jason Sawin
AAAI
2000
15 years 5 months ago
What Sensing Tells Us: Towards a Formal Theory of Testing for Dynamical Systems
Just as actions can have indirect effects on the state of the world, so too can sensing actions have indirect effects on an agent's state of knowledge. In this paper, we inve...
Sheila A. McIlraith, Richard B. Scherl