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» The Complexity of Planarity Testing
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DAC
2007
ACM
16 years 5 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
ICSE
2009
IEEE-ACM
16 years 5 months ago
Taint-based directed whitebox fuzzing
We present a new automated white box fuzzing technique and a tool, BuzzFuzz, that implements this technique. Unlike standard fuzzing techniques, which randomly change parts of the...
Vijay Ganesh, Tim Leek, Martin C. Rinard
ISBI
2008
IEEE
16 years 5 months ago
Multiresolution identification of germ layer components in teratomas derived from human and nonhuman primate embryonic stem cell
We propose a system for identification of germ layer components in teratomas derived from human and nonhuman primate embryonic stem cells. Tissue regeneration and repair, drug tes...
Amina Chebira, John A. Ozolek, Carlos A. Castro, W...
CHI
2009
ACM
16 years 5 months ago
Towards systematic usability verification
Although usability is the core aspect of the whole HCI research field, it still waits for its economic breakthrough. There are some corporations that are famous for their usable p...
Jan Borchers, Jonathan Diehl, Markus Jordans, Max ...
RECOMB
2005
Springer
16 years 5 months ago
The Factor Graph Network Model for Biological Systems
Abstract. We introduce an extended computational framework for studying biological systems. Our approach combines formalization of existing qualitative models that are in wide but ...
Irit Gat-Viks, Amos Tanay, Daniela Raijman, Ron Sh...