2877 search results - page 49 / 576 » The Complexity of Planarity Testing |
DAC
2005
ACM
14 years 10 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
DDECS
2007
IEEE
14 years 3 months ago
2007
IEEE
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
FCT
2007
Springer
14 years 3 months ago
2007
Springer
We present quantum query complexity bounds for testing algebraic properties. For a set S and a binary operation on S, we consider the decision problem whether S is a semigroup or ...
ECAI
2008
Springer
13 years 10 months ago
2008
Springer
This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framewo...