2877 search results - page 92 / 576 » The Complexity of Planarity Testing |
129
Voted
DDECS
2008
IEEE
15 years 10 months ago
2008
IEEE
— Testing SoC is a challenging task, especially when addressing complex and highfrequency devices. Among the different techniques that can be exploited, Software-Based Selft-Test...
151
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KBSE
2008
IEEE
15 years 10 months ago
2008
IEEE
—Automated tests are important for Web applications as they grow more complex day by day. Web application testing frameworks have emerged to help satisfy this need. However, used...
107
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
118
Voted
DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
109
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CDC
2008
IEEE
15 years 6 months ago
2008
IEEE
Abstract-- Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on...