4190 search results - page 17 / 838 » The Cost of Design |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
JCM
2006
13 years 9 months ago
2006
In this paper, we introduce a novel medium access control (MAC) protocol for Radio Frequency Identification (RFID) systems. This protocol exploits the Markov Chain Model of Slotted...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
ICRA
2007
IEEE
14 years 4 months ago
2007
IEEE
— Designing algorithms for multi-robot systems can be a complex and difficult process: the cost of such systems can be very high, collecting experimental data can be timeconsumi...
EOR
2007
13 years 9 months ago
2007
We consider a supply chain design problem where the decision maker needs to decide the number and locations of the distribution centers (DCs). Customers face random demand, and ea...