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DAC
2006
ACM
14 years 12 months ago
Unknown-tolerance analysis and test-quality control for test response compaction using space compactors
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon W...
GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
14 years 3 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham
ISCA
2009
IEEE
199views Hardware» more  ISCA 2009»
14 years 5 months ago
SigRace: signature-based data race detection
Detecting data races in parallel programs is important for both software development and production-run diagnosis. Recently, there have been several proposals for hardware-assiste...
Abdullah Muzahid, Darío Suárez Graci...
DAC
2002
ACM
14 years 12 months ago
Software-based diagnosis for processors
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
Li Chen, Sujit Dey
ICDCS
2000
IEEE
14 years 3 months ago
On Low-Cost Error Containment and Recovery Methods for Guarded Software Upgrading
To assure dependable onboard evolution, we have developed a methodology called guarded software upgrading (GSU). In this paper, we focus on a low-cost approach to error containmen...
Ann T. Tai, Kam S. Tso, Leon Alkalai, Savio N. Cha...