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DAC
2009
ACM
14 years 9 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2009
ACM
14 years 9 months ago
Dynamic thermal management via architectural adaptation
Exponentially rising cooling/packaging costs due to high power density call for architectural and software-level thermal management. Dynamic thermal management (DTM) techniques co...
Ramkumar Jayaseelan, Tulika Mitra
DAC
2009
ACM
14 years 9 months ago
ILP-based pin-count aware design methodology for microfluidic biochips
Digital microfluidic biochips have emerged as a popular alternative for laboratory experiments. To make the biochip feasible for practical applications, pin-count reduction is a k...
Cliff Chiung-Yu Lin, Yao-Wen Chang
DAC
2008
ACM
14 years 9 months ago
DeFer: deferred decision making enabled fixed-outline floorplanner
In this paper, we present DeFer -- a fast, high-quality and nonstochastic fixed-outline floorplanning algorithm. DeFer generates a non-slicing floorplan by compacting a slicing fl...
Jackey Z. Yan, Chris Chu
DAC
2004
ACM
14 years 9 months ago
Heterogeneous MP-SoC: the solution to energy-efficient signal processing
To meet conflicting flexibility, performance and cost constraints of demanding signal processing applications, future designs in this domain will contain an increasing number of a...
Tim Kogel, Heinrich Meyr