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WSC
1998
13 years 8 months ago
A Rapid Modeling Technique for Measurable Improvements in Factory Performance
This paper discusses a methodology for quickly investigating problem areas in semiconductor wafer fabrication factories by creating a model for the production area of interest onl...
Andreas Peikert, Josef Thoma, Steven Brown
CORR
2006
Springer
102views Education» more  CORR 2006»
13 years 7 months ago
Theoretical Properties of Projection Based Multilayer Perceptrons with Functional Inputs
Many real world data are sampled functions. As shown by Functional Data Analysis (FDA) methods, spectra, time series, images, gesture recognition data, etc. can be processed more e...
Fabrice Rossi, Brieuc Conan-Guez
DELTA
2002
IEEE
14 years 12 days ago
Teaching Integrated Circuit and Semiconductor Device Design in New Zealand: The University of Canterbury Approach
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry...
Richard J. Blaikie, Maan M. Alkaisi, Steven M. Dur...
IEICET
2010
76views more  IEICET 2010»
13 years 6 months ago
Planar Waveguide Arrays for Millimeter Wave Systems
Design of high gain and high efficiency antennas is one of the key challenges in antenna engineering and especially in millimeter wave communication systems. Various types of plan...
Makoto Ando
ASPDAC
2000
ACM
113views Hardware» more  ASPDAC 2000»
13 years 11 months ago
A smart imager for the vision processing front-END
ACMOS PWM imager which realizes block summation and 2D projection of a thresholded image, in addition to rowparallel PWM readout with gray scale, is reported. An imager including 5...
Noriaki Takeda, Mitsuru Homma, Makoto Nagata, Taka...