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ESEM
2008
ACM
13 years 10 months ago
Defect categorization: making use of a decade of widely varying historical data
This paper describes our experience in aggregating a number of historical datasets containing inspection defect data using different categorization schemes. Our goal was to make u...
Carolyn B. Seaman, Forrest Shull, Myrna Regardie, ...
TSE
2002
96views more  TSE 2002»
13 years 7 months ago
Better Reliability Assessment and Prediction through Data Clustering
This paper presents a new approach to software reliability modeling by grouping data into clusters of homogeneous failure intensities. This series of data clusters associated with...
Jeff Tian

Publication
260views
12 years 7 months ago
Alternative Astronomical FITS Imaging
Some important information on images of radio sources, such as radio flux and the noise of the map, is not easily accessible by astronomers other than radio astronomers, unless the...
E.E. Varsaki, N.A.B. Gizani, V. Fotopoulos and A.N...
SIGCOMM
2010
ACM
13 years 8 months ago
DDE: dynamic data structure excavation
Dynamic Datastructure Excavation (DDE) is a new approach to extract datastructures from C binaries without any need for debugging symbols. Unlike most existing tools, DDE uses dyn...
Asia Slowinska, Traian Stancescu, Herbert Bos
DATE
2009
IEEE
115views Hardware» more  DATE 2009»
14 years 2 months ago
Automated data analysis solutions to silicon debug
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
Yu-Shen Yang, Nicola Nicolici, Andreas G. Veneris