212 search results - page 32 / 43 » The Impact of Memory Models on Software Reliability in Multi... |
ISLPED
2009
ACM
14 years 2 months ago
2009
ACM
The theoretical lower limit of subthreshold swing in MOSFETs (60 mV/decade) significantly restricts low voltage operation since it results in a low ON to OFF current ratio at low ...
SIGMETRICS
2011
ACM
12 years 11 months ago
2011
ACM
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...
ECEASST
2008
13 years 7 months ago
2008
In software engineering, reliability and development time are two of the most important aspects, therefore, modeling environments, which aide both, are widely used during software ...
CODES
2010
IEEE
13 years 6 months ago
2010
IEEE
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
HPCA
2006
IEEE
14 years 8 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...