This paper presents an efficient statistical design methodology that allows simultaneous sizing for performance and optimization for yield and robustness of analog circuits. The s...
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ra...
This contribution describes a general mixed-integer linear programming model based on a time-indexed formulation covering the relevant features required for the complete supply ch...
We present an optimization algorithm that combines active learning and locally-weighted regression to find extreme points of noisy and complex functions. We apply our algorithm to...
This paper presents a problem-independent framework that uni es various mechanisms for solving discrete constrained nonlinear programming (NLP) problems whose functions are not ne...