Abstract. Data sets in large applications are often too massive to t completely inside the computer's internal memory. The resulting input output communication or I O between ...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
Previous research has shown that the SPEC benchmarks achieve low miss ratios in relatively small instruction caches. This paper presents evidence that current software-development...
Richard Uhlig, David Nagle, Trevor N. Mudge, Stuar...
Particle swarm optimization (PSO) has been in practice for more than 10 years now and has gained wide popularity in various optimization tasks. In the context to single objective ...