570 search results - page 7 / 114 » The behavior of resistive circuits |
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
- It is important to model the substrate coupling for mixed-signal circuit designs today. This paper presents the direct boundary element method (BEM) for substrate resistance calc...
TC
1998
13 years 7 months ago
1998
—This paper describes a new signed-digit full adder (SDFA) circuit consisting of resonant-tunneling diodes (RTDs) and metal-oxide semiconductor field effect transistors (MOSFETs)...
CORR
2007
Springer
13 years 7 months ago
2007
Springer
: New nanotechnology based devices are replacing CMOS devices to overcome CMOS technology’s scaling limitations. However, many such devices exhibit nonmonotonic I-V characteristi...
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Attack resistance has been a critical concern for security-related applications. Various side-channel attacks can be launched to retrieve security information such as encryption k...