549 search results - page 83 / 110 » The corner arc algorithm |
122
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CVPR
2003
IEEE
16 years 4 months ago
2003
IEEE
In this paper, we propose a Bayesian approach to image hallucination. Given a generic low resolution image, we hallucinate a high resolution image using a set of training images. ...
114
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CVPR
2007
IEEE
16 years 4 months ago
2007
IEEE
In this paper, we introduce the Skellam distribution as a sensor noise model for CCD or CMOS cameras. This is derived from the Poisson distribution of photons that determine the s...
103
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DAC
2008
ACM
16 years 3 months ago
2008
ACM
Since process and environmental variations can no longer be ignored in high-performance microprocessor designs, it is necessary to develop techniques for computing the sensitiviti...
127
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DAC
2004
ACM
16 years 3 months ago
2004
ACM
Current Static Timing Analysis (STA) techniques allow one to verify the timing of a circuit at different process corners which only consider cases where all the supplies are low o...
116
Voted
ESOP
2010
Springer
15 years 11 months ago
2010
Springer
Transient faults are single-shot hardware errors caused by high energy particles from space, manufacturing defects, overheating, and other sources. Such faults can be devastating f...