A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
Realization of high-performance domino logic depends strongly on energy-efficient and noise-tolerant interconnect design in ultra deep sub-micron processes. We characterize the c...
Ki-Wook Kim, Seong-Ook Jung, Unni Narayanan, C. L....
—Coordinated checkpointing simplifies failure recovery and eliminates domino effects in case of failures by preserving a consistent global checkpoint on stable storage. However, ...
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
Susmita Sur-Kolay, Marly Roncken, Ken S. Stevens, ...