3 search results - page 1 / 1 » Thermal-Aware SoC Test Scheduling with Test Set Partitioning... |
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
DSD
2009
IEEE
14 years 2 months ago
2009
IEEE
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...