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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 1 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
IPPS
2005
IEEE
14 years 1 months ago
A Maintenance-Oriented Fault Model for the DECOS Integrated Diagnostic Architecture
Abstract— The increasing use of electronics in the automotive and avionic domain has lead to dramatic improvements with respect to functionality, safety, and cost. However, with ...
Philipp Peti, Roman Obermaisser, Astrit Ademaj, He...
DSN
2004
IEEE
13 years 11 months ago
Fault Tolerance Tradeoffs in Moving from Decentralized to Centralized Embedded Systems
Some safety-critical distributed embedded systems may need to use centralized components to achieve certain dependability properties. The difficulty in combining centralized and d...
Jennifer Morris, Daniel Kroening, Philip Koopman
SEUS
2008
IEEE
14 years 1 months ago
Delay-Aware Mobile Transactions
In the expanding e-society, mobile embedded systems are increasingly used to support transactions such as for banking, stock or database applications. Such systems entail a range o...
Brahim Ayari, Abdelmajid Khelil, Neeraj Suri
IEEEAMS
2003
IEEE
14 years 23 days ago
Building Autonomic Systems Via Configuration
Large classes of autonomic (self-managing, selfhealing) systems can be created by logically integrating simpler autonomic systems. The configuration method is widely used for such...
Sanjai Narain, Thanh Cheng, Brian A. Coan, Vikram ...