— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
Networks of communicating finite-state machines equipped with local clocks generate timed MSCs. We consider the problem of checking whether these timed MSCs are "consistent&qu...
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
Commonly used scheduling algorithms in high-level synthesis only accept one process at a time and are not capable of sharing resources across process boundaries. This results in t...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...