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FASE
2004
Springer
14 years 3 months ago
Filtering TOBIAS Combinatorial Test Suites
TOBIAS is a combinatorial testing tool, aimed at the production of large test suites. In this paper, TOBIAS is applied to conformance tests for model-based specifications (express...
Yves Ledru, Lydie du Bousquet, Olivier Maury, Pier...
ISVLSI
2008
IEEE
152views VLSI» more  ISVLSI 2008»
14 years 4 months ago
Improving the Test of NoC-Based SoCs with Help of Compression Schemes
Re-using the network in a NoC-based system as a test access mechanism is an attractive solution as pointed out by several authors. As a consequence, testing of NoC-based SoCs is b...
Julien Dalmasso, Érika F. Cota, Marie-Lise ...
ATS
2009
IEEE
132views Hardware» more  ATS 2009»
14 years 4 months ago
On Improving Diagnostic Test Generation for Scan Chain Failures
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
DATE
2010
IEEE
110views Hardware» more  DATE 2010»
14 years 2 months ago
Multi-temperature testing for core-based system-on-chip
—Recent research has shown that different defects can manifest themselves as failures at different temperature spectra. Therefore, we need multi-temperature testing which applies...
Zhiyuan He, Zebo Peng, Petru Eles
DAC
2007
ACM
14 years 11 months ago
SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects
The test time for core-external interconnect shorts/opens is typically much less than that for core-internal logic. Therefore, prior work on test infrastructure design for core-ba...
Qiang Xu, Yubin Zhang, Krishnendu Chakrabarty